Senior specialist in laboratory analysis in the domains of:
atmospheric physics and chemistry, X-ray spectrometry, single particle analysis (SPA), security scanners, low temperature plasma - modeling of electrical discharge.
Optimization of research techniques and methodologies in determination of lowest detection levels of chemical elements in specific conditions, qualitative and quantitative elemental analysis in micro scale fractions.
Strong background, technical expertise and hands-on experience in areas of:
1. Scanning Electron Microscopy, Transmission Electron Microscopy, microanalysis (SEM/TEM/EDS)
2. Microscopy imaging with computer integration and scientific imaging software
3. Materials, materials characterization and their properties
4. Measurement techniques:
4.1. Determination of Volatile Organic Compounds in traces by Proton Transfer Reaction – Mass Spectrometer
4.2. Single particle analysis (Electron Probe Micro Analysis) by
4.2.1. JEOL Superprobe 733 Electron Microscope coupled with EDX Oxford detector
4.2.2. JEOL JSM-6390 SEM
4.3. Data analysis:
4.3.1. X-ray spectra analysis (using WinAXIL software package)
4.3.2. Hierarchical cluster analysis (using IDAS software package).
atmospheric physics and chemistry, X-ray spectrometry, single particle analysis (SPA), security scanners, low temperature plasma - modeling of electrical discharge.
Optimization of research techniques and methodologies in determination of lowest detection levels of chemical elements in specific conditions, qualitative and quantitative elemental analysis in micro scale fractions.
Strong background, technical expertise and hands-on experience in areas of:
1. Scanning Electron Microscopy, Transmission Electron Microscopy, microanalysis (SEM/TEM/EDS)
2. Microscopy imaging with computer integration and scientific imaging software
3. Materials, materials characterization and their properties
4. Measurement techniques:
4.1. Determination of Volatile Organic Compounds in traces by Proton Transfer Reaction – Mass Spectrometer
4.2. Single particle analysis (Electron Probe Micro Analysis) by
4.2.1. JEOL Superprobe 733 Electron Microscope coupled with EDX Oxford detector
4.2.2. JEOL JSM-6390 SEM
4.3. Data analysis:
4.3.1. X-ray spectra analysis (using WinAXIL software package)
4.3.2. Hierarchical cluster analysis (using IDAS software package).
